To evaluate the hydrophobic/hydrophilic behaviour of synthesized coatings a drop shape analyzer (DSA100 by Krüss) is available in the group. Any desired liquid can be droped in a precise manner on top of the investigated coating.

XPS (X-ray Photoelectron Spectroscopy), also known as ESCA (Electron Spectroscopy for Chemical Analysis) is a powerful instrument for the investigation of surfaces concerning their elemental composition or empirical formula and the determination of the chemical as well as electronic state of the elements. Working principal of this method is the measurement of photoelectrons and their kinetic energy from 0 to 1000 eV which are emitted from the top 1-10 nm layer of the material during Al Kα x-ray irradiation under high vacuum (10^-9 to 10^-10 bar) conditions.

Typical samples can consist of inorganic materials like pure elements, metal alloys, semiconductors, glasses, ceramics but also organic or natural compounds like polymers, catalysts, woods, plant parts, bio materials can be measured. In these samples all elements except hydrogen and helium, due to their small orbital diameter, can be detected usually in a range up to parts per thousand, under special conditions even up to parts per million (ppm).

In the working group Mathur XPS data is usually used to evaluate questions of element composition of the surface (1 - 10 nm) of a sample, possible surface contaminations, emperical formula of a pure material, electronic state of each element on the surface to determine the oxidation state as well as homogeneous distribution of the element composition throughout a sample.

The Scanning Probe Microscope (SPM, Park Systems XE series) plays an important role for exploring the world of nano technology by offering surface imaging of the measured samples at atomic level. On one hand, based on quantum tunnelling, the Scanning Tunnelling Microscope (STM) records every change of the tunnelling current between the probe tip and the sample surface in a vacuum state. Since the tunnelling current is a function of tip position and local density of states of the sample surface, surface topography information can be then acquired as the tip scans over an area of the sample. Nevertheless, STM measurements are limited to those samples which are conducting or semiconducting. On the other hand, Atomic Force Microscope (AFM) provide a whole new range of measurement capabilities. With the cantilever scanning over sample surfaces, either in contact or non-contact with the surface, the AFM monitors the displace of the cantilever with the help of a piezoelectric element with high accuracy and precision. It is not limited to electrical conducting materials. Furthermore, depending on the demand of the users and specific sample properties, it is able to perform such measurements that reveal physical, chemical, mechanical, electrical and magnetic properties of the sample surface.